<p>Wheat blast, a disease caused by the fungal pathogen <i>Magnaporthe oryzae pathotype Triticum</i>,
threatens global wheat production. Limited epidemiological information makes
the wheat blast disease hard to contain and control, and without data,
recommendations about the selection and deployment of resistant cultivars
remain a challenge. Besides, cultivar selection relies on human visual disease
evaluations, which can be time-consuming, labor-intensive, and subjective. We
hypothesized that epidemiological parameters could be relevant to support wheat
blast breeding tactics, and reliable visual estimates paired with images of
wheat spike blast could be used to train deep convolutional neural networks
(DCNN) models for disease severity classification. To test these hypotheses, we
focused on the following objectives: 1) to evaluate ten cultivars for wheat
blast resistance under field conditions using epidemiological parameters, and
2) develop accurate and reliable DCNN models to classify wheat spike blast
severity under controlled conditions. For objective 1, we evaluated wheat leaf
blast and wheat spike blast severity and estimated the total area under the disease
progress curve (tAUDPC), final disease severity, and epidemic type. Disease
progress curves of ten cultivars were fitted by the logistic (R<sup>2</sup>=0.70-0.96)
and Gompertz (R<sup>2</sup>=0.64-0.94) models, pointing out to polycyclic
epidemics. We concluded that tAUDPC, disease progression rate, and final
disease severity could support cultivar selection for wheat blast resistance.
For objective 2, wheat spike blast severity was visually estimated, and Red Green
Blue images were acquired from six cultivars with various resistance levels
under controlled conditions. Severity estimations were paired with each wheat
spike image and created two datasets. Dataset 1 (n=5,123) included maturing and
non-matured wheat spikes, and Dataset 2 (n=4,509) had only non-matured spikes.
Each dataset was analyzed for inter-rater agreement between disease severity
estimation of two pathologists and disease measurements of Image J, then classified
by severity categories to train and test the DCNN model. The model trained with
only non-matured spikes had higher precision (0.90-0.95), F-1 (0.87-0.95), and
recall (0.84-0.96) than the model trained with maturing and non-matured spikes
(0.75-0.95, 0.79-0.95, and 0.74-0.96, respectively). We concluded that the
trained DCNN model could be used as the basis of a phenotyping tool for wheat
spike blast severity classification.</p>