Effect of Film Thickness on CeO₂/Au Vertically Aligned Nanocomposite Morphology and Properties

The primary goal of this work is to gain a fundamental understanding on how growth conditions affect the morphology and crystallography orientation of CeO₂/Au vertically aligned nanocomposite (VAN) thin films. Focus has been placed on how the changes in morphology and crystallography translate to tunable optical properties. The morphological effects have been observed and analyzed via two main approaches: the change in morphology was observed at multiple points along the film thickness, and the morphology at the film/substrate interface has been analyzed with respect to total film thickness. The changes in Au crystallography orientations have been observed by measuring peak shift in XRD patterns and determining the resulting in- and out-of-plane strain. To observe additional effects of this morphology change, optical measurements have been taken for films at the bottom, middle, and top of the thickness range. Strong trends in transmittance, plasmonic absorption peak shifts and hyperbolic permittivity behavior are correlated with the film thickness. This tunability of optical properties likely arises from changes in both Au pillar phase morphology and crystal orientation. These findings demonstrate that changing film thickness may be a desirable method to easily tune the morphology and optical properties of VAN thin films.